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System Design/Engineering Review Report.md
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System Design/Engineering Review Report.md
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# Engineering Review Report
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## A. Executive Summary
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### Overall System Maturity Level
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The ASF Sensor Hub demonstrates a well-structured architecture with clear layering, defined responsibilities, and adherence to embedded system constraints. However, several critical gaps and risks need to be addressed before proceeding to the implementation phase.
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### Major Risks (Top 5)
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1. **Cross-Feature Conflicts**: Potential timing conflicts between OTA updates and DAQ operations.
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2. **State Machine Completeness**: Undefined transitions for error handling and degraded states.
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3. **Data Integrity Risks**: Insufficient guarantees for data persistence during power loss.
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4. **Security Gaps**: Lack of detailed secure boot and cryptographic key management mechanisms.
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5. **Scalability Concerns**: Limited provisions for adding new sensor types or features.
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### Go / No-Go Recommendation
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**No-Go**: Address the identified critical risks and gaps before proceeding to the implementation phase.
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---
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## B. Detailed Findings
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### 1. Architecture
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#### Findings:
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- **Layering & Separation of Concerns**: Proper abstraction boundaries are defined, but direct hardware access by features bypassing the System Manager is a risk. **Severity: Major**
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- **State Machine Validity**: Some states (e.g., ERROR, DEGRADED) lack defined transitions and behaviors. **Severity: Critical**
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#### Recommendations:
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- Enforce strict access controls to hardware and persistence layers.
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- Define and document all state transitions and behaviors.
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### 2. Requirements
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#### Findings:
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- **Missing Requirements**: No explicit requirements for handling SD card wear or power loss scenarios. **Severity: Critical**
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- **Conflicting Requirements**: OTA updates may interfere with real-time DAQ operations. **Severity: Major**
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#### Recommendations:
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- Add requirements for wear leveling and power loss recovery.
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- Define OTA timing constraints to avoid conflicts.
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### 3. Performance
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#### Findings:
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- **Memory Usage Risks**: High-frequency sampling and local filtering may exceed ESP32-S3 memory limits. **Severity: Major**
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#### Recommendations:
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- Optimize memory usage by profiling and limiting buffer sizes.
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### 4. Reliability
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#### Findings:
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- **Fault Tolerance**: No defined behavior for sensor failures during runtime. **Severity: Major**
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#### Recommendations:
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- Implement fallback mechanisms for failed sensors.
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### 5. Security
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#### Findings:
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- **Secure Boot**: No detailed mechanism for secure boot and firmware authenticity verification. **Severity: Critical**
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#### Recommendations:
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- Implement secure boot and cryptographic verification for firmware.
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### 6. Maintainability
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#### Findings:
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- **Scalability**: Adding new sensors requires significant manual effort. **Severity: Minor**
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#### Recommendations:
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- Use a modular approach for sensor integration.
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---
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## C. Missing / Risky Areas
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### Missing System Requirements
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- SD card wear leveling.
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- Power loss recovery mechanisms.
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### Missing System States
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- Detailed ERROR and DEGRADED state transitions.
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### Missing Failure Handling
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- Sensor failure fallback mechanisms.
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### Missing Documentation
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- Secure boot and cryptographic key management.
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---
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## D. Improvement Recommendations
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1. **Architectural Enhancements**:
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- Enforce strict abstraction boundaries.
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- Define all state transitions and behaviors.
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2. **Requirement Additions**:
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- Add requirements for SD card wear leveling and power loss recovery.
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3. **Security Improvements**:
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- Implement secure boot and cryptographic verification mechanisms.
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4. **Scalability Enhancements**:
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- Adopt a modular approach for sensor integration.
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---
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## E. Generated Artifacts
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### State Machine Diagram
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```mermaid
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graph TD
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INIT --> IDLE
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IDLE --> RUNNING
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RUNNING --> DEGRADED
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RUNNING --> ERROR
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DEGRADED --> TEARDOWN
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ERROR --> TEARDOWN
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TEARDOWN --> INIT
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```
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### Cross-Feature Conflict Table
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| Feature A | Feature B | Conflict Description | Resolution Recommendation |
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|-----------------|-----------------|-------------------------------|----------------------------------|
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| OTA | DAQ | Timing conflicts | Define OTA timing constraints |
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| Persistence | Power Loss | Data corruption risks | Add wear leveling and recovery |
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---
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